MAGNATEST TCL – Eddy Current Sorter

Smart and efficient material and structure testing

The MAGNATEST TCL is designed to carry out fully automated, non-destructive eddy current testing for 100% inspection in series production. It is a cutting-edge system designed for smart and efficient material and structure testing, perfect for Eddy Current Sorter needs. In addition, it can be used for manual testing, e.g. in a laboratory for quality assurance. The MAGNATEST TCL test system consists of the test channel line (TCL) and a PC with testing software. For automated inspection, FOERSTER offers an industrial PC equipped with an interface module.

All the constituent parts of the MAGNATEST TCL can be installed in an equipment cabinet. Alternatively, its compact design allows installation directly in the line. This significantly shortens the cable lengths required between the sensor system and the test channel and minimizes negative impacts on the test quality. The modern software of the TCL test system is intuitive and optimized for touch operation. Embedded help screens and a wizard are available for setting up test parameters, enhancing the user experience for Eddy Current Hardness Sorting Machine applications.

In addition to a wide frequency range (4 Hz to 20 MHz), the MAGNATEST TCL features fundamental and harmonic evaluation. The test can be triggered manually, externally by the PLC, or automatically (internally). Password protection prevents outside intervention in the test. In test mode, the results are displayed in the impedance plane and as a bar graph. Afterwards, the report function facilitates comprehensive documentation.

Your advantages at a glance

  • Magneto-inductive  testing  with  fundamental  and harmonic evaluation: broad  frequency  range  from  4  Hz  to  20 MHz, continuously adjustable in 1 Hz steps
  • 100%  control  using  non-destructive  testing  method: ideal for all eddy current testing requirements
  • State-of-the-art  software with intuitive user interface: support  functions  (wizard)  ensure  easy  operation during parameterization
  • Improved  test  quality: short cable runs between the MAGNATEST TCL and the sensor system minimize interference
  • Innovative probe recognition: data chip automatically recognizes the probe, directly loading its settings
  • Easy automation and line integration via I/O interface